media: ov5640: Disable transparent feature for test pattern

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The transparent feature for test patterns blends the test pattern with
an actual captured image. This makes the result non-static, subject to
changes in the sensor's field of view.

Test patterns should be predictable and deterministic, even if they are
dynamic patterns. Disable the transparent feature of the test pattern.

Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>

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Chen-Yu Tsai 2019-01-18 03:52:03 -05:00 • committed by Mauro Carvalho Chehab

parent a0c29afb50

commit 2aff1fc365

1 changed files with 1 additions and 2 deletions

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drivers/media/i2c/ov5640.c

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