media: imx258: remove test pattern map from driver

Browse source

change bayer order when using test pattern mode.
remove test pattern mapping method

[Sakari Ailus: Drop extra added newline]

Signed-off-by: Chen, JasonX Z <jasonx.z.chen@intel.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>

...

This commit is contained in:

Chen, JasonX Z 2018-11-07 21:47:34 -05:00 • committed by Mauro Carvalho Chehab

parent 9ffd7ffe65

commit 53f6f81da7

1 changed files with 3 additions and 19 deletions

Show all changes Ignore whitespace when comparing lines Ignore changes in amount of whitespace Ignore changes in whitespace at EOL

Download patch file Download diff file Expand all files Collapse all files

22

drivers/media/i2c/imx258.c

View file