media: ov2640: add V4L2_CID_TEST_PATTERN control

Browse source

The ov2640 has the test pattern generator features.  This makes use of
it through V4L2_CID_TEST_PATTERN control.

[Sakari Ailus: Use "Eight Vertical Colour Bars" as the second manu entry]

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>

...

This commit is contained in:

Akinobu Mita 2018-11-12 11:00:50 -05:00 • committed by Mauro Carvalho Chehab

parent dde64f725a

commit 6210500691

1 changed files with 13 additions and 1 deletions

Show all changes Ignore whitespace when comparing lines Ignore changes in amount of whitespace Ignore changes in whitespace at EOL

Download patch file Download diff file Expand all files Collapse all files

14

drivers/media/i2c/ov2640.c

View file