selftests/xsk: Add new test case for AF_XDP under max ring sizes

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Introduce a test case to evaluate AF_XDP's robustness by pushing hardware
and software ring sizes to their limits. This test ensures AF_XDP's
reliability amidst potential producer/consumer throttling due to maximum
ring utilization. The testing strategy includes:

1. Configuring rings to their maximum allowable sizes.
2. Executing a series of tests across diverse batch sizes to assess
   system's behavior under different configurations.

Signed-off-by: Tushar Vyavahare <tushar.vyavahare@intel.com>
Signed-off-by: Daniel Borkmann <daniel@iogearbox.net>
Acked-by: Magnus Karlsson <magnus.karlsson@intel.com>
Link: https://lore.kernel.org/bpf/20240402114529.545475-8-tushar.vyavahare@intel.com

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Tushar Vyavahare 2024-04-02 11:45:29 +00:00 • committed by Daniel Borkmann

parent c4f960539f

commit c53908b254

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tools/testing/selftests/bpf/xskxceiver.c

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